Determination of the Poisson ratio of (001) and (111) oriented thin films of In2O3 by synchrotron-based x-ray diffraction
The Poisson ratio ν of In 2O 3 has been determined by measurement of the covariation of in-plane and out-of-plane lattice parameters of strained thin films grown epitaxially on (111) and (001) oriented cubic Y-stabilized ZrO 2 substrates. The experimental results are in good agreement with values fo...
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Detalles Bibliográficos
| Main Authors: |
Zhang, K,
Regoutz, A,
Palgrave, R,
Payne, D,
Egdell, R,
Walsh, A,
Collins, S,
Wermeille, D,
Cowley, R |
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| Formato: | Journal article
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| Idioma: | English |
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| Publicado: |
2011
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