$Oxford HEXameter: laboratory high energy X-ray diffractometer for bulk residual stress analysis$

Oxford HEXameter: laboratory high energy X-ray diffractometer for bulk residual stress analysis

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Diffraction of penetrating radiation such as neutrons or high energy X-rays provides a powerful non-destructive method for the evaluation of residual stresses in engineering components. In particular, strain scanning using synchrotron energy-dispersive X-ray diffraction has been shown to offer a fas...

Bibliografiset tiedot
Päätekijät:	Korsunsky, A, Zhang, S, Dini, D, Vorster, W, Liu, J
Aineistotyyppi:	Journal article
Kieli:	English
Julkaistu:	Trans Tech Publications 2006
Aiheet:	Engineering & allied sciences

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