STIMULATED RECOMBINATION AND THE DYNAMIC MOTT TRANSITION IN GaTe.

The dynamics of photoexcited carriers in direct gap semiconductors can now be measured directly by time-resolved spectroscopy using intense, ultra-short laser pulses. High carrier densities can be generated and the processes of carrier cooling and recombination can be investigated by measuring band-...

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Bibliographic Details
Main Authors: Ironside, C, Taylor, R, Ryan, J
Format: Journal article
Language:English
Published: Springer-Verlag 1985