InGaN super-lattice growth for fabrication of quantum dot containing microdisks

Microstructural characterisation of a heterostructure containing an In xGa1-xN/InyGa1-yN super-lattice sacrificial layer (SSL), an AlGaN etch stop layer and an InGaN quantum dot layer has been carried out. These structures are intended for photo-electrochemical etch mediated fabrication of undercut...

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Bibliographic Details
Main Authors: El-Ella, H, Rol, F, Collins, D, Kappers, M, Taylor, R, Hu, E, Oliver, R
Format: Journal article
Language:English
Published: 2011