Time-resolved retardance and optic-axis angle measurement system for characterization of flexoelectro-optic liquid crystal and other birefringent devices
A new polarimeter is presented which gives time-resolved measurements of both the optic-axis angle and the linear phase retardation for modulated birefringent optical devices. It is suitable for characterizing dynamic waveplate devices based on liquid crystal and other materials. It is fully automat...
| Үндсэн зохиолчид: | , , , |
|---|---|
| Формат: | Journal article |
| Хэвлэсэн: |
Optical Society of America
2018
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