Characterisation of a saturated single frequency Ne-like Ge XUV laser on the J=0->1 transition at 19.6 nm

We report on measurements of a saturated single frequency Ne-like Ge XUV laser on the J = 0->1 transition at 19.6 nm from a refraction compensating double target driven by 150 J of energy from 75 ps Nd-laser pulses. The 19.6 nm line completely dominated the laser output. The output energy was...

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Bibliographic Details
Main Authors:	Zhang, J, Warwick, P, Wolfrum, E, Key, M, Danson, C, Demir, A, Healy, S, Kalantar, D, Kim, N, Lewis, C, Lin, J, MacPhee, A, Neely, D, Nilsen, J, Pert, G, Smith, R, Tallents, G, Wark, J
Format:	Conference item
Published:	1996

Characterisation of a saturated single frequency Ne-like Ge XUV laser on the J=0-&gt;1 transition at 19.6 nm

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Characterisation of a saturated single frequency Ne-like Ge XUV laser on the J=0->1 transition at 19.6 nm