Characterisation of a saturated single frequency Ne-like Ge XUV laser on the J=0->1 transition at 19.6 nm
We report on measurements of a saturated single frequency Ne-like Ge XUV laser on the J = 0->1 transition at 19.6 nm from a refraction compensating double target driven by 150 J of energy from 75 ps Nd-laser pulses. The 19.6 nm line completely dominated the laser output. The output energy was...
Main Authors: | , , , , , , , , , , , , , , , , , |
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Format: | Conference item |
Published: |
1996
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