POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTIPLE QUANTUM-WELL STRUCTURES

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTIPLE QUANTUM-WELL STRUCTURES

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Bibliografiska uppgifter
Huvudupphovsmän:	Cerezo, A, Liddle, J, Grovenor, C
Materialtyp:	Conference item
Publicerad:	1989

Liknande verk

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTIPLE QUANTUM-WELL STRUCTURES
av: Cerezo, A, et al.
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POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTI-QUANTUM-WELL STRUCTURES
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APPLICATION OF POSITION-SENSITIVE ATOM PROBE TO THE STUDY OF THE MICROCHEMISTRY AND MORPHOLOGY OF QUANTUM WELL INTERFACES
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POSITION-SENSITIVE ATOM PROBE AND STEM ANALYSIS OF THE MICROCHEMISTRY OF GAINAS/INP QUANTUM WELLS
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APPLICATION OF A POSITION-SENSITIVE ATOM PROBE TO THE ANALYSIS OF THE CHEMISTRY AND MORPHOLOGY OF MULTI-QUANTUM-WELL INTERFACES
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MATERIALS ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
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SURFACE-ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
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ULTRA-HIGH-RESOLUTION CHEMICAL-ANALYSIS BY FIELD-ION MICROSCOPY, ATOM PROBE AND POSITION-SENSITIVE ATOM-PROBE TECHNIQUES
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STRUCTURAL-ANALYSIS WITH THE POSITION-SENSITIVE ATOM PROBE
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PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
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PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTOR EPILAYERS
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PULSED LASER ATOM PROBE ANALYSIS OF TERNARY AND QUATERNARY III-V EPITAXIAL LAYERS
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3D atom probe analysis of quantum well and quantum dot materials
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PULSED LASER ATOM PROBE ANALYSIS OF GAAS AND INAS
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PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
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RECENT DEVELOPMENTS IN POSITION-SENSITIVE ATOM-PROBE MICROANALYSIS
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THE POSITION-SENSITIVE ATOM PROBE - RECONSTRUCTION OF THE ATOMIC CHEMISTRY OF SOLIDS IN 3-DIMENSIONS (SUMMARY)
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DEVELOPMENT AND INITIAL APPLICATIONS OF A POSITION-SENSITIVE ATOM PROBE
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APPLICATION OF A POSITION-SENSITIVE DETECTOR TO ATOM PROBE MICROANALYSIS
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RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
av: Grovenor, C, et al.
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RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
av: Grovenor, C, et al.
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LATERAL AND DEPTH SCALE CALIBRATION OF THE POSITION-SENSITIVE ATOM-PROBE
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ATOM PROBE ANALYSIS OF A CERAMIC OXIDE SUPERCONDUCTOR
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PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTORS
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RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.
av: Grovenor, C, et al.
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1990 BURCH,C.R. PRIZE - JOINT AWARD - THE POSITION-SENSITIVE ATOM PROBE
av: Cerezo, A
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Three-dimensional atom probe analysis of green- and blue-emitting In(x)Ga(1-x)N/GaN multiple quantum well structures
av: Galtrey, M, et al.
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ULTRAHIGH RESOLUTION CHARACTERIZATION OF COMPOUND SEMICONDUCTORS USING PULSED LASER ATOM PROBE TECHNIQUES
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FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS
av: Grovenor, C, et al.
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ATOM PROBE STUDIES OF THE COMPOSITION OF LOW-TEMPERATURE OXIDES ON (100) SILICON AND GALLIUM-ARSENIDE SURFACES
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Atom probe revels the structure of InxGe1-xN based quantum wells in three dimensions
av: Galtrey, M, et al.
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Three-dimensional atom probe studies of an InxGa1-xN/GaN multiple quantum well structure: Assessment of possible indium clustering
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ANALYSIS OF NANOMETER-SIZED PRECIPITATES USING ATOM PROBE TECHNIQUES
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POSITION-SENSITIVE ATOM PROBE STUDIES OF THE COMPOSITION OF OMEGA AND THETA' PRECIPITATES IN AL-CU-MG-AG ALLOYS
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POSITION-SENSITIVE ATOM-PROBE STUDY OF THE DECOMPOSITION OF A CU-2.6AT-PERCENT-CO ALLOY
av: Setna, R, et al.
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3-DIMENSIONAL VISUALIZATION OF SEMICONDUCTOR MULTI-QUANTUM-WELL INTERFACES
av: Mackenzie, R, et al.
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3-DIMENSIONAL VISUALIZATION OF SEMICONDUCTOR MULTI-QUANTUM-WELL INTERFACES
av: Mackenzie, R, et al.
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Three dimensional visualization of semiconductor multi-quantum well interfaces
av: Mackenzie, R, et al.
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ATOM PROBE ANALYSIS OF PRECIPITATES IN ALZNMG ALLOY 7018
av: Ortner, S, et al.
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THE CHARACTERIZATION OF SILICON SURFACES BY TIME-OF-FLIGHT ATOM PROBE ANALYSIS
av: Grovenor, C, et al.
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