NEUTRON REFLECTIVITY FROM A SILICON-NITRIDE LAYER ON A SILICON SUBSTRATE

The neutron reflectivity from a sample consisting of a silicon nitride layer on a crystalline silicon substrate has been measured. The structure of the sample normal to the reflecting surface has been modelled to produce a scattering length density profile whose simulated reflectivity matches that e...

Szczegółowa specyfikacja

Opis bibliograficzny
Główni autorzy: Ashworth, C, Messoloras, S, Stewart, R, Wilkes, J, Baldwin, I, Penfold, J
Format: Journal article
Język:English
Wydane: 1989