Direct observation and evolution of electronic coupling between organic semiconductors
The data is in-situ spectroscopic ellipsometry data (mainly for psi and delta) used in the development and application of the DART method. CompleteEASE software from J.A.Woollam company was used for acquisition using RC2 Woollam ellipsometer, and exported in text document format. It can be imported...
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Format: | Dataset |
Language: | English |
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University of Oxford
2020
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