Direct observation and evolution of electronic coupling between organic semiconductors

The data is in-situ spectroscopic ellipsometry data (mainly for psi and delta) used in the development and application of the DART method. CompleteEASE software from J.A.Woollam company was used for acquisition using RC2 Woollam ellipsometer, and exported in text document format. It can be imported...

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Bibliographic Details
Main Authors: Vajjala Kesava, S, Riede, M
Format: Dataset
Language:English
Published: University of Oxford 2020
Subjects: