Corona charge in SiO2: kinetics and surface passivation for high efficiency silicon solar cells
This manuscript presents a method by which capacitance-voltage measurements can be used in conjunction with Kelvin-probe measurements to calculate the location of charge within a dielectric layer. A first order kinetic model for the transport of charge into SiO 2 films after exposure to corona ch...
| Հիմնական հեղինակներ: | , , , , , |
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| Ձևաչափ: | Conference item |
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Elsevier
2016
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