An in-situ approach for preparing atom probe tomography specimens by xenon plasma-focused ion beam
A method for the rapid preparation of atom probe tomography (APT) needles using a xenon plasma-focussed ion beam (FIB) instrument is presented and demonstrated on a test sample of Ti-6Al-4V alloy. The method requires significantly less operator input than the standard lift-out protocol, is site-spec...
| প্রধান লেখক: | , , , , , |
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| বিন্যাস: | Journal article |
| প্রকাশিত: |
Elsevier
2019
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