Stability and spectroscopy of single nitrogen dopants in graphene at elevated temperatures
Single nitrogen (N) dopants in graphene are investigated using atomic-resolution scanning transmission electron microscopy (STEM) combined with electron energy loss spectroscopy (EELS). Using an in situ heating holder at 500°C provided us with clean graphene surfaces, and we demonstrate that isolate...
| Main Authors: | , , , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
American Chemical Society
2014
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