Aberration characterization of x-ray optics using multi-modal ptychography and a partially coherent source
Ptychography is a scanning coherent diffraction imaging technique that provides high-resolution imaging and complete spatial information of the complex probe and object transmission function. The wavefront error caused by aberrated optics has previously been recovered using ptychography when a highl...
Autores principales: | Moxham, TEJ, Laundy, D, Dhamgaye, V, Fox, OJL, Sawhney, K, Korsunsky, AM |
---|---|
Formato: | Journal article |
Lenguaje: | English |
Publicado: |
American Institute of Physics
2021
|
Ejemplares similares
-
Hard X-ray ptychography for optics characterization using a partially coherent synchrotron source
por: Moxham, TEJ, et al.
Publicado: (2020) -
Two-dimensional wavefront characterization of adaptable corrective optics and Kirkpatrick-Baez mirror system using ptychography
por: Moxham, TEJ, et al.
Publicado: (2022) -
The development of partially coherent X-ray beam ptychography and adaptable optics for the study of nanomaterials
por: Moxham, TEJ
Publicado: (2022) -
Alvarez varifocal X-ray lens
por: Vishal Dhamgaye, et al.
Publicado: (2023-07-01) -
Nanoscale correlative X-ray spectroscopy and ptychography of carious dental enamel
por: Besnard, C, et al.
Publicado: (2022)