Aberration characterization of x-ray optics using multi-modal ptychography and a partially coherent source
Ptychography is a scanning coherent diffraction imaging technique that provides high-resolution imaging and complete spatial information of the complex probe and object transmission function. The wavefront error caused by aberrated optics has previously been recovered using ptychography when a highl...
| Main Authors: | , , , , , |
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| פורמט: | Journal article |
| שפה: | English |
| יצא לאור: |
American Institute of Physics
2021
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