Transmission electron microscopy: Overview and challenges
We review recent advances in aberration-corrected scanning transmission electron microscopy that allow sub-Angstrom beams to be used for imaging and spectroscopy, with enormous improvement in sensitivity for single atom detection and the investigation of interfacial electronic structure. Comparison...
| Main Authors: | , , , , , , , , |
|---|---|
| Format: | Conference item |
| Published: |
2003
|