Electrochemical impacts complement light scattering techniques for in situ nanoparticle sizing

We show that the electrochemical particle-impact technique (or ‘nano-impacts’) complements light scattering techniques for sizing both mono- and poly-disperse nanoparticles. It is found that established techniques – Dynamic Light Scattering (DLS) and Nanoparticle Tracking Analysis (NTA) – can accura...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς: Xie, R, Batchelor-Mcauley, C, Young, N, Compton, R
Μορφή: Journal article
Γλώσσα:English
Έκδοση: Royal Society of Chemistry 2019