Electrochemical impacts complement light scattering techniques for in situ nanoparticle sizing

We show that the electrochemical particle-impact technique (or ‘nano-impacts’) complements light scattering techniques for sizing both mono- and poly-disperse nanoparticles. It is found that established techniques – Dynamic Light Scattering (DLS) and Nanoparticle Tracking Analysis (NTA) – can accura...

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Detalhes bibliográficos
Principais autores: Xie, R, Batchelor-Mcauley, C, Young, N, Compton, R
Formato: Journal article
Idioma:English
Publicado em: Royal Society of Chemistry 2019