SURFACE-ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
A position-sensitive detector has been combined with time-of-flight mass spectrometry in a short-flight-path atom probe to yield an instrument in which both the chemical identity and surface position are obtained for individual atoms removed by field evaporation from the surface of a field-ion speci...
| 主要な著者: | , , , |
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| フォーマット: | Journal article |
| 言語: | English |
| 出版事項: |
1989
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