Low-dose aberration-free imaging of Li-rich cathode materials at various states of charge using electron ptychography
Imaging the complete atomic structure of materials, including light elements, with minimal beam-induced damage of the sample is a long-standing challenge in electron microscopy. Annular bright-field scanning transmission electron microscopy is often used to image elements with low atomic numbers, bu...
| Main Authors: | , , , , |
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| Format: | Journal article |
| Published: |
American Chemical Society
2018
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