GaAs high temperature optical constants and application to optical monitoring within the MOVPE environment
The real and imaginary components of the GaAs refractive index at temperatures between 20-700 degrees C have been obtained. Measurements were made by comparing the variable angle reflectivity of p-polarized and s-polarized 633 nm wavelength light from a deoxidized GaAs surface. By using these temper...
主要な著者: | Allwood, D, Klipstein, P, Mason, N, Nicholas, R, Walker, P |
---|---|
フォーマット: | Conference item |
出版事項: |
Minerals, Metals and Materials Soc (TMS)
2000
|
類似資料
-
Advanced AlGaAs/GaAs Heterostructures Grown by MOVPE
著者:: Maxim A. Ladugin, 等
出版事項: (2019-06-01) -
PHOTOLUMINESCENCE AT HIGH-PRESSURES FROM HIGHLY STRAINED MOVPE GROWN GAAS/GASB/GAAS HETEROSTRUCTURES
著者:: Warburton, R, 等
出版事項: (1991) -
Growth parameters of InAs/GaAs quantum dots grown by MOVPE
著者:: Roslan, Sharizar, 等
出版事項: (2006) -
Growth parameters of InAs/GaAs quantum dots grown by MOVPE /
著者:: Zulkafli Othaman, author, 等
出版事項: (2007) -
Arsenic Diffusion in MOVPE‐Grown GaAs/Ge Epitaxial Structures
著者:: V. Orejuela, 等
出版事項: (2024-09-01)