GaAs high temperature optical constants and application to optical monitoring within the MOVPE environment
The real and imaginary components of the GaAs refractive index at temperatures between 20-700 degrees C have been obtained. Measurements were made by comparing the variable angle reflectivity of p-polarized and s-polarized 633 nm wavelength light from a deoxidized GaAs surface. By using these temper...
| 主要な著者: | , , , , |
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| フォーマット: | Conference item |
| 出版事項: |
Minerals, Metals and Materials Soc (TMS)
2000
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