Ultrafast x-ray diffraction using a streak-camera detector in averaging mode.

We demonstrate an apparatus for measuring time-dependent x-ray diffraction. X-ray pulses from a synchrotron are diffracted by a pair of Si(111) crystals and detected with an x-ray streak camera that has single-shot resolution of better than 1 ps. The streak camera is driven by a photoconductive swit...

Volledige beschrijving

Bibliografische gegevens
Hoofdauteurs: Larsson, J, Chang, Z, Judd, E, Schuck, P, Falcone, R, Heimann, P, Padmore, H, Kapteyn, H, Bucksbaum, P, Murnane, M, Lee, R, Machacek, A, Wark, J, Liu, X, Shan, B
Formaat: Journal article
Taal:English
Gepubliceerd in: 1997