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Atomic scale characterization...
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Atomic scale characterization of buried In(x)Ga(1-x)As quantum dots using pulsed laser atom probe tomography
Bibliographic Details
Main Authors:
Mueller, M
,
Cerezo, A
,
Smith, G
,
Chang, L
,
Gerstl, S
Format:
Journal article
Published:
2008
Holdings
Description
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