Atomic scale characterization of buried In(x)Ga(1-x)As quantum dots using pulsed laser atom probe tomography

Atomic scale characterization of buried In(x)Ga(1-x)As quantum dots using pulsed laser atom probe tomography

Bibliographic Details
Main Authors:	Mueller, M, Cerezo, A, Smith, G, Chang, L, Gerstl, S
Format:	Journal article
Published:	2008

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