Carrier dynamics in ion-implanted GaAs studied by simulation and observation of terahertz emission

We have experimentally measured the terahertz radiation from a series of ion-implanted semiconductors, both from the bare semiconductor surface and from photoconductive switches fabricated on them. GaAs was implanted with As + ions, and InGaAs and InP with Fe+ ions, and all samples were annealed pos...

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Bibliographic Details
Main Authors: Lloyd-Hughes, J, Castro-Camus, E, Fraser, MD, Jagadish, C, Johnston, M
Format: Journal article
Language:English
Published: 2004