RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.

RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.

Pulsed Laser Atom Probe (PLAP) analysis has recently been applied to a range of semiconductor samples in Oxford. It has been shown for the first time that the stoichiometry of III-V semiconductors and of thin amorphous silicon layers, can be accurately analysed by the use of the PLAP. The compositio...

Disgrifiad llawn

Manylion Llyfryddiaeth
Prif Awduron:	Grovenor, C, Cerezo, A, Smith, G
Fformat:	Journal article
Iaith:	English
Cyhoeddwyd:	1985

Eitemau Tebyg

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS
gan: Grovenor, C, et al.
Cyhoeddwyd: (1983)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
gan: Grovenor, C, et al.
Cyhoeddwyd: (1990)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
gan: Grovenor, C, et al.
Cyhoeddwyd: (1990)

RECENT DEVELOPMENTS IN POSITION-SENSITIVE ATOM-PROBE MICROANALYSIS
gan: Smith, G, et al.
Cyhoeddwyd: (1994)

Some recent advances in three dimensional atomic scale microanalysis with the atom probe (invited)
gan: Cerezo, A, et al.
Cyhoeddwyd: (1994)

APPLICATION OF A POSITION-SENSITIVE DETECTOR TO ATOM PROBE MICROANALYSIS
gan: Cerezo, A, et al.
Cyhoeddwyd: (1988)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
gan: Cerezo, A, et al.
Cyhoeddwyd: (1986)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
gan: Grovenor, C, et al.
Cyhoeddwyd: (1987)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTORS
gan: Cerezo, A, et al.
Cyhoeddwyd: (1986)

APPLICATIONS OF ATOM-PROBE MICROANALYSIS IN MATERIALS SCIENCE
gan: Miller, M, et al.
Cyhoeddwyd: (1994)

QUANTITATIVE STUDY OF SOLID-STATE REACTIONS BY ATOM PROBE MICROANALYSIS
gan: Smith, G
Cyhoeddwyd: (1987)

TRACE-ELEMENT DETECTION AT THE ATOMIC LEVEL BY ATOM PROBE MICROANALYSIS
gan: Beaven, P, et al.
Cyhoeddwyd: (1980)

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF VANADIUM
gan: Godfrey, T, et al.
Cyhoeddwyd: (1989)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTOR EPILAYERS
gan: Mackenzie, R, et al.
Cyhoeddwyd: (1990)

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF NB3SN WIRES
gan: Rose, J, et al.
Cyhoeddwyd: (1986)

Microanalysis at the atomic level
gan: Pennycook, S, et al.
Cyhoeddwyd: (1995)

PULSED LASER ATOM PROBE ANALYSIS OF GAAS AND INAS
gan: Cerezo, A, et al.
Cyhoeddwyd: (1985)

Optimisation of mass ranging for atom probe microanalysis and application to the corrosion processes in Zr alloys.
gan: Hudson, D, et al.
Cyhoeddwyd: (2011)

SURFACE-ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
gan: Cerezo, A, et al.
Cyhoeddwyd: (1989)

Accuracy of pulsed laser atom probe tomography for compound semiconductor analysis
gan: Mueller, M, et al.
Cyhoeddwyd: (2011)

Compositional nonuniformities in pulsed laser atom probe tomography analysis of compound semiconductors
gan: Mueller, M, et al.
Cyhoeddwyd: (2012)

ATOM PROBE ANALYSIS OF A CERAMIC OXIDE SUPERCONDUCTOR
gan: Cerezo, A, et al.
Cyhoeddwyd: (1988)

Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
gan: Müller, M, et al.
Cyhoeddwyd: (2010)

Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
gan: Muller, M, et al.
Cyhoeddwyd: (2010)

ATOM PROBE STUDIES OF THE COMPOSITION OF LOW-TEMPERATURE OXIDES ON (100) SILICON AND GALLIUM-ARSENIDE SURFACES
gan: Grovenor, C, et al.
Cyhoeddwyd: (1989)

CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESS FRINGE IMAGING
gan: Glaisher, R, et al.
Cyhoeddwyd: (1993)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTI-QUANTUM-WELL STRUCTURES
gan: Liddle, J, et al.
Cyhoeddwyd: (1989)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTIPLE QUANTUM-WELL STRUCTURES
gan: Cerezo, A, et al.
Cyhoeddwyd: (1989)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTIPLE QUANTUM-WELL STRUCTURES
gan: Cerezo, A, et al.
Cyhoeddwyd: (1989)

ANALYSIS OF NANOMETER-SIZED PRECIPITATES USING ATOM PROBE TECHNIQUES
gan: Cerezo, A, et al.
Cyhoeddwyd: (1990)

Quantitative Analysis of Be in Herderite by Electron Probe Microanalysis
gan: Ze LIU, et al.
Cyhoeddwyd: (2024-09-01)

ULTRAHIGH RESOLUTION CHARACTERIZATION OF COMPOUND SEMICONDUCTORS USING PULSED LASER ATOM PROBE TECHNIQUES
gan: Mackenzie, R, et al.
Cyhoeddwyd: (1991)

APPLICATION OF POSITION-SENSITIVE ATOM PROBE TO THE STUDY OF THE MICROCHEMISTRY AND MORPHOLOGY OF QUANTUM WELL INTERFACES
gan: Liddle, J, et al.
Cyhoeddwyd: (1989)

Overview: Recent progress in three-dimensional atom probe instruments and applications
gan: Cerezo, A, et al.
Cyhoeddwyd: (2007)

Overview: recent progress in three-dimensional atom probe instruments and applications.
gan: Cerezo, A, et al.
Cyhoeddwyd: (2007)

MATERIALS ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
gan: Cerezo, A, et al.
Cyhoeddwyd: (1989)

DEVELOPMENT AND INITIAL APPLICATIONS OF A POSITION-SENSITIVE ATOM PROBE
gan: Cerezo, A, et al.
Cyhoeddwyd: (1988)

APPLICATION OF A POSITION-SENSITIVE ATOM PROBE TO THE ANALYSIS OF THE CHEMISTRY AND MORPHOLOGY OF MULTI-QUANTUM-WELL INTERFACES
gan: Cerezo, A, et al.
Cyhoeddwyd: (1989)

Studies of boundaries and interfaces on the atomic scale by atom probe FIM
gan: Smith, G, et al.
Cyhoeddwyd: (1998)

THE CHARACTERIZATION OF SILICON SURFACES BY TIME-OF-FLIGHT ATOM PROBE ANALYSIS
gan: Grovenor, C, et al.
Cyhoeddwyd: (1982)