RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.

RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.

Pulsed Laser Atom Probe (PLAP) analysis has recently been applied to a range of semiconductor samples in Oxford. It has been shown for the first time that the stoichiometry of III-V semiconductors and of thin amorphous silicon layers, can be accurately analysed by the use of the PLAP. The compositio...

Deskribapen osoa

Xehetasun bibliografikoak
Egile Nagusiak:	Grovenor, C, Cerezo, A, Smith, G
Formatua:	Journal article
Hizkuntza:	English
Argitaratua:	1985

Antzeko izenburuak

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS
nork: Grovenor, C, et al.
Argitaratua: (1983)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
nork: Grovenor, C, et al.
Argitaratua: (1990)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
nork: Grovenor, C, et al.
Argitaratua: (1990)

RECENT DEVELOPMENTS IN POSITION-SENSITIVE ATOM-PROBE MICROANALYSIS
nork: Smith, G, et al.
Argitaratua: (1994)

Some recent advances in three dimensional atomic scale microanalysis with the atom probe (invited)
nork: Cerezo, A, et al.
Argitaratua: (1994)

APPLICATION OF A POSITION-SENSITIVE DETECTOR TO ATOM PROBE MICROANALYSIS
nork: Cerezo, A, et al.
Argitaratua: (1988)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
nork: Cerezo, A, et al.
Argitaratua: (1986)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
nork: Grovenor, C, et al.
Argitaratua: (1987)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTORS
nork: Cerezo, A, et al.
Argitaratua: (1986)

APPLICATIONS OF ATOM-PROBE MICROANALYSIS IN MATERIALS SCIENCE
nork: Miller, M, et al.
Argitaratua: (1994)

QUANTITATIVE STUDY OF SOLID-STATE REACTIONS BY ATOM PROBE MICROANALYSIS
nork: Smith, G
Argitaratua: (1987)

TRACE-ELEMENT DETECTION AT THE ATOMIC LEVEL BY ATOM PROBE MICROANALYSIS
nork: Beaven, P, et al.
Argitaratua: (1980)

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF VANADIUM
nork: Godfrey, T, et al.
Argitaratua: (1989)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTOR EPILAYERS
nork: Mackenzie, R, et al.
Argitaratua: (1990)

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF NB3SN WIRES
nork: Rose, J, et al.
Argitaratua: (1986)

PULSED LASER ATOM PROBE ANALYSIS OF GAAS AND INAS
nork: Cerezo, A, et al.
Argitaratua: (1985)

Microanalysis at the atomic level
nork: Pennycook, S, et al.
Argitaratua: (1995)

Optimisation of mass ranging for atom probe microanalysis and application to the corrosion processes in Zr alloys.
nork: Hudson, D, et al.
Argitaratua: (2011)

SURFACE-ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
nork: Cerezo, A, et al.
Argitaratua: (1989)

Accuracy of pulsed laser atom probe tomography for compound semiconductor analysis
nork: Mueller, M, et al.
Argitaratua: (2011)

Compositional nonuniformities in pulsed laser atom probe tomography analysis of compound semiconductors
nork: Mueller, M, et al.
Argitaratua: (2012)

ATOM PROBE ANALYSIS OF A CERAMIC OXIDE SUPERCONDUCTOR
nork: Cerezo, A, et al.
Argitaratua: (1988)

Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
nork: Müller, M, et al.
Argitaratua: (2010)

Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
nork: Muller, M, et al.
Argitaratua: (2010)

ATOM PROBE STUDIES OF THE COMPOSITION OF LOW-TEMPERATURE OXIDES ON (100) SILICON AND GALLIUM-ARSENIDE SURFACES
nork: Grovenor, C, et al.
Argitaratua: (1989)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTI-QUANTUM-WELL STRUCTURES
nork: Liddle, J, et al.
Argitaratua: (1989)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTIPLE QUANTUM-WELL STRUCTURES
nork: Cerezo, A, et al.
Argitaratua: (1989)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTIPLE QUANTUM-WELL STRUCTURES
nork: Cerezo, A, et al.
Argitaratua: (1989)

ULTRAHIGH RESOLUTION CHARACTERIZATION OF COMPOUND SEMICONDUCTORS USING PULSED LASER ATOM PROBE TECHNIQUES
nork: Mackenzie, R, et al.
Argitaratua: (1991)

ANALYSIS OF NANOMETER-SIZED PRECIPITATES USING ATOM PROBE TECHNIQUES
nork: Cerezo, A, et al.
Argitaratua: (1990)

CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESS FRINGE IMAGING
nork: Glaisher, R, et al.
Argitaratua: (1993)

Quantitative Analysis of Be in Herderite by Electron Probe Microanalysis
nork: Ze LIU, et al.
Argitaratua: (2024-09-01)

APPLICATION OF POSITION-SENSITIVE ATOM PROBE TO THE STUDY OF THE MICROCHEMISTRY AND MORPHOLOGY OF QUANTUM WELL INTERFACES
nork: Liddle, J, et al.
Argitaratua: (1989)

Overview: Recent progress in three-dimensional atom probe instruments and applications
nork: Cerezo, A, et al.
Argitaratua: (2007)

Overview: recent progress in three-dimensional atom probe instruments and applications.
nork: Cerezo, A, et al.
Argitaratua: (2007)

MATERIALS ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
nork: Cerezo, A, et al.
Argitaratua: (1989)

APPLICATION OF A POSITION-SENSITIVE ATOM PROBE TO THE ANALYSIS OF THE CHEMISTRY AND MORPHOLOGY OF MULTI-QUANTUM-WELL INTERFACES
nork: Cerezo, A, et al.
Argitaratua: (1989)

DEVELOPMENT AND INITIAL APPLICATIONS OF A POSITION-SENSITIVE ATOM PROBE
nork: Cerezo, A, et al.
Argitaratua: (1988)

Studies of boundaries and interfaces on the atomic scale by atom probe FIM
nork: Smith, G, et al.
Argitaratua: (1998)

THE CHARACTERIZATION OF SILICON SURFACES BY TIME-OF-FLIGHT ATOM PROBE ANALYSIS
nork: Grovenor, C, et al.
Argitaratua: (1982)