Time-resolved x-ray diffraction study of ultrafast acoustic phonon dynamics in Ge/Si-heterostructures

Time-resolved x-ray diffraction study of ultrafast acoustic phonon dynamics in Ge/Si-heterostructures

Using time-resolved x-ray diffraction the ultafast strain dynamics in fs-laserexcited Ge/Si-heterostructures has been studied. A fluence dependent, anharmonic damping of the impulsively generated acoustic phonons and vibrational transport across the buried Ge/Si-interface are observed.

Detalles Bibliográficos
Main Authors: Sokolowski-Tinten, K, Cavalleri, A, Siders, C, Brown, F, Leitner, D, Toth, C, Kammler, M, von Hoegen, M, von der Linde, D, Squier, J, Barty, C, Wilson, K
Formato: Conference item
Publicado: 2001

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