Time-resolved x-ray diffraction study of ultrafast acoustic phonon dynamics in Ge/Si-heterostructures
Using time-resolved x-ray diffraction the ultafast strain dynamics in fs-laserexcited Ge/Si-heterostructures has been studied. A fluence dependent, anharmonic damping of the impulsively generated acoustic phonons and vibrational transport across the buried Ge/Si-interface are observed.
Bibliografiska uppgifter
| Huvudupphovsmän: |
Sokolowski-Tinten, K,
Cavalleri, A,
Siders, C,
Brown, F,
Leitner, D,
Toth, C,
Kammler, M,
von Hoegen, M,
von der Linde, D,
Squier, J,
Barty, C,
Wilson, K |
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| Materialtyp: | Conference item
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| Publicerad: |
2001
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