Time-resolved x-ray diffraction study of ultrafast acoustic phonon dynamics in Ge/Si-heterostructures
Using time-resolved x-ray diffraction the ultafast strain dynamics in fs-laserexcited Ge/Si-heterostructures has been studied. A fluence dependent, anharmonic damping of the impulsively generated acoustic phonons and vibrational transport across the buried Ge/Si-interface are observed.
Автори: | Sokolowski-Tinten, K, Cavalleri, A, Siders, C, Brown, F, Leitner, D, Toth, C, Kammler, M, von Hoegen, M, von der Linde, D, Squier, J, Barty, C, Wilson, K |
---|---|
Формат: | Conference item |
Опубліковано: |
2001
|
Схожі ресурси
Схожі ресурси
-
Direct observation of ultrafast non-thermal melting by ultrafast x-ray diffraction
за авторством: Siders, C, та інші
Опубліковано: (2001) -
Anharmonic lattice dynamics in germanium measured with ultrafast x-ray diffraction.
за авторством: Cavalleri, A, та інші
Опубліковано: (2000) -
Detection of nonthermal melting by ultrafast X-ray diffraction.
за авторством: Siders, C, та інші
Опубліковано: (1999) -
Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast X-ray diffraction
за авторством: Sokolowski-Tinten, K, та інші
Опубліковано: (2001) -
Time-resolved X-ray diffraction study of ultrafast structural dynamics in laser-excited solids
за авторством: Sokolowski-Tinten, K, та інші
Опубліковано: (2003)