Measuring errors in single-qubit rotations by pulsed electron paramagnetic resonance

Measuring errors in single-qubit rotations by pulsed electron paramagnetic resonance

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The ability to measure and reduce systematic errors in single-qubit logic gates is crucial when evaluating quantum computing implementations. We describe pulsed electron paramagnetic resonance (EPR) sequences that can be used to measure precisely even small systematic errors in rotations of electron...

Полное описание

Библиографические подробности
Главные авторы:	Morton, J, Tyryshkin, A, Ardavan, A, Porfyrakis, K, Lyon, SA, Briggs, G
Формат:	Journal article
Язык:	English
Опубликовано:	2005

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