Measuring errors in single-qubit rotations by pulsed electron paramagnetic resonance
The ability to measure and reduce systematic errors in single-qubit logic gates is crucial when evaluating quantum computing implementations. We describe pulsed electron paramagnetic resonance (EPR) sequences that can be used to measure precisely even small systematic errors in rotations of electron...
| 主要な著者: | , , , , , |
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| フォーマット: | Journal article |
| 言語: | English |
| 出版事項: |
2005
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