Probing deformation and revealing microstructural mechanisms with cross-correlation-based, high-resolution electron backscatter diffraction
High-resolution, cross-correlation-based, electron backscatter diffraction (HR-EBSD) is an emerging technique capable of measuring elastic strains, lattice rotations, and defect populations in crystalline materials. Here we briefly review development of the technique and the fundamental method. Appl...
| Main Authors: | , , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
2013
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