The three-dimensional microstructure of polycrystalline materials unravelled by synchrotron light
Synchrotron radiation X-ray imaging and diffraction techniques offer new possibilities for non-destructive bulk characterization of polycrystalline materials. Minute changes in electron density (different crystallographic phases, cracks, porosities) can be detected using 3D imaging modes exploiting...
| Main Authors: | , , , , , , , , |
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| Format: | Journal article |
| Language: | French |
| Published: |
2011
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