Developments in C-s-corrected STEM

Developments in C-s-corrected STEM

The new corrector of spherical aberration (C-s) we have built for a Scanning Transmission Electron Microscope (STEM) is described. We have recently installed such a corrector in a dedicated 100 kV STEM at Oak Ridge National Laboratory and the first results are presented. We conclude by discussing up...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς:	Lupini, A, Krivanek, O, Dellby, N, Nellist, P, Pennycook, S
Μορφή:	Conference item
Έκδοση:	2001

Παρόμοια τεκμήρια

Towards sub-0.5 angstrom beams through aberration corrected STEM
ανά: Nellist, P, κ.ά.
Έκδοση: (2004)

Aberration-corrected STEM: current performance and future directions
ανά: Nellist, P, κ.ά.
Έκδοση: (2006)

Progress in aberration-corrected scanning transmission electron microscopy.
ανά: Dellby, N, κ.ά.
Έκδοση: (2001)

Nanoscale structure/property correlation through aberration-corrected stem and theory
ανά: Pennycook, S, κ.ά.
Έκδοση: (2003)

An Aberration-Corrected STEM for Diffraction Studies.
ανά: Krivanek, O, κ.ά.
Έκδοση: (2005)

Design and Testing of a Quadrupole/Octupole C3/C5 Aberration Corrector.
ανά: Dellby, N, κ.ά.
Έκδοση: (2005)

Direct sub-angstrom imaging of a crystal lattice.
ανά: Nellist, P, κ.ά.
Έκδοση: (2004)

Materials analysis by aberration-corrected STEM
ανά: Krivanek, O, κ.ά.
Έκδοση: (2005)

Spectroscopic imaging of single atoms within a bulk solid.
ανά: Varela, M, κ.ά.
Έκδοση: (2004)

Towards sub-0.5 A electron beams.
ανά: Krivanek, O, κ.ά.
Έκδοση: (2003)

Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution.
ανά: Pennycook, T, κ.ά.
Έκδοση: (2014)

Aberration measurement using the Ronchigram contrast transfer function.
ανά: Lupini, A, κ.ά.
Έκδοση: (2010)

Aberration measurement using the Ronchigram constrast transfer function
ανά: Lupini, A, κ.ά.
Έκδοση: (2010)

Quantitative sub-angstrom imaging through ADF STEM
ανά: Nellist, P, κ.ά.
Έκδοση: (1998)

Accurate structure determination from image reconstruction in ADF STEM
ανά: Nellist, P, κ.ά.
Έκδοση: (1998)

Subangstrom resolution imaging using annular dark-field STEM
ανά: Nellist, P, κ.ά.
Έκδοση: (1999)

On the origin of transverse incoherence in Z-contrast STEM.
ανά: Rafferty, B, κ.ά.
Έκδοση: (2001)

Direct structure determination by atomic-resolution incoherent STEM imaging
ανά: Nellist, P, κ.ά.
Έκδοση: (1997)

EELS in the STEM: Determination of materials properties on the atomic scale
ανά: Browning, N, κ.ά.
Έκδοση: (1997)

Z-contrast Imaging in an Aberration-corrected Scanning Transmission Electron Microscope.
ανά: Pennycook, S, κ.ά.
Έκδοση: (2000)

Making the link between ADF and 4D STEM: Resolution, transfer and coherence
ανά: Nellist, PD, κ.ά.
Έκδοση: (2024)

HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis.
ανά: Peng, Y, κ.ά.
Έκδοση: (2004)

Efficient phase contrast imaging in STEM using a pixelated detector. Part II: Optimisation of imaging conditions.
ανά: Yang, H, κ.ά.
Έκδοση: (2014)

High angle dark field STEM for advanced materials
ανά: Pennycook, S, κ.ά.
Έκδοση: (1996)

Determination of atomic structure at surfaces and interfaces by high-resolution stem
ανά: Pennycook, S, κ.ά.
Έκδοση: (1997)

Subangstrom resolution by underfocused incoherent transmission electron microscopy
ανά: Nellist, P, κ.ά.
Έκδοση: (1998)

The principles and interpretation of annular dark-field Z-contrast imaging
ανά: Nellist, P, κ.ά.
Έκδοση: (2000)

Z-contrast scanning transmission electron microscopy
ανά: Pennycook, S, κ.ά.
Έκδοση: (1999)

Atomic resolution Z-contrast imaging of ultradispersed catalysts
ανά: Nellist, P, κ.ά.
Έκδοση: (1997)

Incoherent imaging using dynamically scattered coherent electrons
ανά: Nellist, P, κ.ά.
Έκδοση: (1999)

Direct imaging of the atomic configuration of ultradispersed catalysts
ανά: Nellist, P, κ.ά.
Έκδοση: (1996)

Transmission electron microscopy: Overview and challenges
ανά: Pennycook, S, κ.ά.
Έκδοση: (2003)

A Bloch wave analysis of optical sectioning in aberration-corrected STEM.
ανά: Cosgriff, E, κ.ά.
Έκδοση: (2007)

STEM Image Post-processing for Instability and Aberration Correction for Transfer Function Extension
ανά: Jones, L, κ.ά.
Έκδοση: (2012)

Direct observations of atomic structures of defects in GaN by high resolution Z-contrast stem
ανά: Xin, Y, κ.ά.
Έκδοση: (1998)

Quantitative techniques for aberration corrected HAADF STEM of nano-materials
ανά: E, H, κ.ά.
Έκδοση: (2012)

Prospects for 3D characterization of materials by aberration-corrected STEM and SCEM
ανά: Nellist, P, κ.ά.
Έκδοση: (2007)

Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images.
ανά: E, H, κ.ά.
Έκδοση: (2013)

Nanoscale momentum-resolved vibrational spectroscopy
ανά: Hage, F, κ.ά.
Έκδοση: (2018)

Near-Ideal Direct-Electron Focused-Probe 4D-STEM Data for Open-Source Phase Reconstructions
ανά: Susi Toma, κ.ά.
Έκδοση: (2024-01-01)