Developments in C-s-corrected STEM

Developments in C-s-corrected STEM

The new corrector of spherical aberration (C-s) we have built for a Scanning Transmission Electron Microscope (STEM) is described. We have recently installed such a corrector in a dedicated 100 kV STEM at Oak Ridge National Laboratory and the first results are presented. We conclude by discussing up...

书目详细资料
Main Authors:	Lupini, A, Krivanek, O, Dellby, N, Nellist, P, Pennycook, S
格式:	Conference item
出版:	2001

相似书籍

Towards sub-0.5 angstrom beams through aberration corrected STEM
由: Nellist, P, et al.
出版: (2004)

Aberration-corrected STEM: current performance and future directions
由: Nellist, P, et al.
出版: (2006)

Progress in aberration-corrected scanning transmission electron microscopy.
由: Dellby, N, et al.
出版: (2001)

Nanoscale structure/property correlation through aberration-corrected stem and theory
由: Pennycook, S, et al.
出版: (2003)

An Aberration-Corrected STEM for Diffraction Studies.
由: Krivanek, O, et al.
出版: (2005)

Design and Testing of a Quadrupole/Octupole C3/C5 Aberration Corrector.
由: Dellby, N, et al.
出版: (2005)

Direct sub-angstrom imaging of a crystal lattice.
由: Nellist, P, et al.
出版: (2004)

Materials analysis by aberration-corrected STEM
由: Krivanek, O, et al.
出版: (2005)

Spectroscopic imaging of single atoms within a bulk solid.
由: Varela, M, et al.
出版: (2004)

Towards sub-0.5 A electron beams.
由: Krivanek, O, et al.
出版: (2003)

Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution.
由: Pennycook, T, et al.
出版: (2014)

Aberration measurement using the Ronchigram contrast transfer function.
由: Lupini, A, et al.
出版: (2010)

Aberration measurement using the Ronchigram constrast transfer function
由: Lupini, A, et al.
出版: (2010)

Quantitative sub-angstrom imaging through ADF STEM
由: Nellist, P, et al.
出版: (1998)

Accurate structure determination from image reconstruction in ADF STEM
由: Nellist, P, et al.
出版: (1998)

Subangstrom resolution imaging using annular dark-field STEM
由: Nellist, P, et al.
出版: (1999)

On the origin of transverse incoherence in Z-contrast STEM.
由: Rafferty, B, et al.
出版: (2001)

Direct structure determination by atomic-resolution incoherent STEM imaging
由: Nellist, P, et al.
出版: (1997)

EELS in the STEM: Determination of materials properties on the atomic scale
由: Browning, N, et al.
出版: (1997)

Z-contrast Imaging in an Aberration-corrected Scanning Transmission Electron Microscope.
由: Pennycook, S, et al.
出版: (2000)

Making the link between ADF and 4D STEM: Resolution, transfer and coherence
由: Nellist, PD, et al.
出版: (2024)

HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis.
由: Peng, Y, et al.
出版: (2004)

Efficient phase contrast imaging in STEM using a pixelated detector. Part II: Optimisation of imaging conditions.
由: Yang, H, et al.
出版: (2014)

High angle dark field STEM for advanced materials
由: Pennycook, S, et al.
出版: (1996)

Determination of atomic structure at surfaces and interfaces by high-resolution stem
由: Pennycook, S, et al.
出版: (1997)

Subangstrom resolution by underfocused incoherent transmission electron microscopy
由: Nellist, P, et al.
出版: (1998)

The principles and interpretation of annular dark-field Z-contrast imaging
由: Nellist, P, et al.
出版: (2000)

Z-contrast scanning transmission electron microscopy
由: Pennycook, S, et al.
出版: (1999)

Atomic resolution Z-contrast imaging of ultradispersed catalysts
由: Nellist, P, et al.
出版: (1997)

Incoherent imaging using dynamically scattered coherent electrons
由: Nellist, P, et al.
出版: (1999)

Direct imaging of the atomic configuration of ultradispersed catalysts
由: Nellist, P, et al.
出版: (1996)

Transmission electron microscopy: Overview and challenges
由: Pennycook, S, et al.
出版: (2003)

A Bloch wave analysis of optical sectioning in aberration-corrected STEM.
由: Cosgriff, E, et al.
出版: (2007)

STEM Image Post-processing for Instability and Aberration Correction for Transfer Function Extension
由: Jones, L, et al.
出版: (2012)

Direct observations of atomic structures of defects in GaN by high resolution Z-contrast stem
由: Xin, Y, et al.
出版: (1998)

Quantitative techniques for aberration corrected HAADF STEM of nano-materials
由: E, H, et al.
出版: (2012)

Prospects for 3D characterization of materials by aberration-corrected STEM and SCEM
由: Nellist, P, et al.
出版: (2007)

Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images.
由: E, H, et al.
出版: (2013)

Nanoscale momentum-resolved vibrational spectroscopy
由: Hage, F, et al.
出版: (2018)

Near-Ideal Direct-Electron Focused-Probe 4D-STEM Data for Open-Source Phase Reconstructions
由: Susi Toma, et al.
出版: (2024-01-01)