Atom probe tomography today

Atom probe tomography today

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This review aims to describe and illustrate the advances in the application of atom probe tomography that have been made possible by recent developments, particularly in specimen preparation techniques (using dual-beam focused-ion beam instruments) but also of the more routine use of laser pulsing....

書誌詳細
主要な著者:	Cerezo, A, Marquis, E, Lozano-Perez, S, Sha, G, Zandbergen, M, Clifton, P, Kelly, T, Larson, D, Thompson, K, Alvis, R, Galtrey, M, Humphreys, C, Oliver, R
フォーマット:	Journal article
出版事項:	2007

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