The advantages of sub-sampling and Inpainting for scanning transmission electron microscopy
Images and spectra obtained from aberration corrected scanning transmission electron microscopes (STEM) are now used routinely to quantify the morphology, structure, composition, chemistry, bonding, and optical/electronic properties of nanostructures, interfaces, and defects in many materials/biolog...
| Main Authors: | , , , , , , , |
|---|---|
| פורמט: | Journal article |
| שפה: | English |
| יצא לאור: |
AIP Publishing
2023
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