In-line measurement of the dielectric permittivity of materials during additive manufacturing and 3D data reconstruction
Additive manufacturing (AM) techniques are used increasingly for the direct fabrication of microwave devices, such as graded index lenses and dielectric resonator antennas, which have spatially-varying dielectric properties (i.e. relative permittivity) that are difficult to manufacture using traditi...
| Main Authors: | , , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
Elsevier
2019
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