In-situ determination of dispersion and resolving power in simultaneous multiple-angle XUV spectroscopy

In-situ determination of dispersion and resolving power in simultaneous multiple-angle XUV spectroscopy

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We report on the simultaneous determination of non-linear dispersion functions and resolving power of three flat-field XUV grating spectrometers. A moderate-intense short-pulse infrared laser is focused onto technical aluminum which is commonly present as part of the experimental setup. In the XUV w...

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Detaylı Bibliyografya
Asıl Yazarlar: Zastrau, U, Hilbert, V, Brown, C, Döppner, T, Dziarzhytski, S, Förster, E, Glenzer, H, Göde, S, Gregori, G, Harmand, M, Hochhaus, D, Laarmann, T, Lee, J, Meiwes-Broer, K, Neumayer, P, Przystawik, A, Radcliffe, P, Schulz, M, Skruszewicz, S, Tavella, F, Tiggesbäumker, J, Toleikis, S, White, T
Materyal Türü: Journal article
Dil:English
Baskı/Yayın Bilgisi: 2011

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