In-situ determination of dispersion and resolving power in simultaneous multiple-angle XUV spectroscopy

In-situ determination of dispersion and resolving power in simultaneous multiple-angle XUV spectroscopy

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We report on the simultaneous determination of non-linear dispersion functions and resolving power of three flat-field XUV grating spectrometers. A moderate-intense short-pulse infrared laser is focused onto technical aluminum which is commonly present as part of the experimental setup. In the XUV w...

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Հիմնական հեղինակներ: Zastrau, U, Hilbert, V, Brown, C, Döppner, T, Dziarzhytski, S, Förster, E, Glenzer, H, Göde, S, Gregori, G, Harmand, M, Hochhaus, D, Laarmann, T, Lee, J, Meiwes-Broer, K, Neumayer, P, Przystawik, A, Radcliffe, P, Schulz, M, Skruszewicz, S, Tavella, F, Tiggesbäumker, J, Toleikis, S, White, T
Ձևաչափ: Journal article
Լեզու:English
Հրապարակվել է: 2011
Նկարագրություն
Ամփոփում:We report on the simultaneous determination of non-linear dispersion functions and resolving power of three flat-field XUV grating spectrometers. A moderate-intense short-pulse infrared laser is focused onto technical aluminum which is commonly present as part of the experimental setup. In the XUV wavelength range of 10-19 nm, the spectrometers are calibrated using Al-Mg plasma emission lines. This cross-calibration is performed in-situ in the very same setup as the actual main experiment. The results are in excellent agreement with ray-tracing simulations. We show that our method allows for precise relative and absolute calibration of three different XUV spectrometers. © 2011 IOP Publishing Ltd and SISSA.

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