High-resolution inelastic x-ray scattering at the high energy density scientific instrument at the European X-Ray Free-Electron Laser

High-resolution inelastic x-ray scattering at the high energy density scientific instrument at the European X-Ray Free-Electron Laser

We introduce a setup to measure high-resolution inelastic x-ray scattering at the High Energy Density scientific instrument at the European X-Ray Free-Electron Laser (XFEL). The setup uses the Si (533) reflection in a channel-cut monochromator and three spherical diced analyzer crystals in near-back...

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Bibliographic Details
Main Authors: Wollenweber, L, Preston, TR, Descamps, A, Cerantola, V, Comley, A, Eggert, JH, Fletcher, LB, Geloni, G, Gericke, DO, Glenzer, SH, Göde, S, Hastings, J, Humphries, OS, Jenei, A, Karnbach, O, Konopkova, Z, Loetzsch, R, Marx-Glowna, B, McBride, EE, McGonegle, D, Monaco, G, Ofori-Okai, BK, Palmer, CAJ, Plückthun, C, Redmer, R, Strohm, C, Thorpe, I, Tschentscher, T, Uschmann, I, Wark, JS, White, TG, Appel, K, Gregori, G, Zastrau, U
Format: Journal article
Language:English
Published: American Institute of Physics 2021

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