A review of recent in situ deformation studies using synchrotron X-ray (Micro) beams
The advent of (sub)microscopic focused X-ray beams at third generation synchrotron sources has opened up possibilities for the characterisation of material structure and mechanical behaviour with unprecedented spatial resolution. Crucially, the non-destructive nature and fast rate of X-ray data coll...
| Päätekijät: | , , , , |
|---|---|
| Aineistotyyppi: | Journal article |
| Kieli: | English |
| Julkaistu: |
2012
|