Atomic layer deposited electron transport Layers in efficient organometallic halide perovskite devices
Amorphous TiO2 and SnO2 electron transport layers (ETLs) were deposited by low-temperature atomic layer deposition (ALD). Surface morphology and x-ray photoelectron spectroscopy (XPS) indicate uniform and pinhole free coverage of these ALD hole blocking layers. Both mesoporous and planar perovskite...
Príomhchruthaitheoirí: | McCarthy, MM, Walter, A, Moon, S-J, Noel, NK, O’Brien, S, Pemble, ME, Nicolay, S, Wenger, B, Snaith, HJ, Povey, IM |
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Formáid: | Conference item |
Foilsithe / Cruthaithe: |
Cambridge University Press
2018
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