Component-wise testing of laser written integrated coupled mode beam splitters
Photonic integrated circuits (PICs) are important enabling technologies for the developments of areas such as quantum information processing (QIP). Coupled-mode integrated beam splitters (IBS) are widely used in many PICs, so direct and accurate testing of individual IBSs inside a PIC is increasingl...
| المؤلفون الرئيسيون: | , , , , |
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| التنسيق: | Journal article |
| منشور في: |
Optical Society of America
2019
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