Component-wise testing of laser written integrated coupled mode beam splitters

Component-wise testing of laser written integrated coupled mode beam splitters

Photonic integrated circuits (PICs) are important enabling technologies for the developments of areas such as quantum information processing (QIP). Coupled-mode integrated beam splitters (IBS) are widely used in many PICs, so direct and accurate testing of individual IBSs inside a PIC is increasingl...

Deskribapen osoa

Xehetasun bibliografikoak
Egile Nagusiak:	Guan, J, Menssen, A, Liu, X, Wang, J, Booth, M
Formatua:	Journal article
Argitaratua:	Optical Society of America 2019

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