Imaging modes for direct electron detection in TEM with column parallel CCD
Electron imaging detectors have become the main limiting factor in transmission electron microscopy (TEM). A transition is now being made from indirect scintillator-coupled cameras to directly exposed detectors, which propose imaging modes that are novel in TEM. This work uses a dataset recoded with...
| Main Authors: | , , , |
|---|---|
| 格式: | Conference item |
| 出版: |
2009
|