MegaMorph -- multi-wavelength measurement of galaxy structure: Sérsic profile fits to galaxies near and far
We demonstrate a new multi-wavelength technique for two-dimensional parametric modelling of galaxy surface-brightness profiles, which we have incorporated into the widely used software GALFIT. Our new method, named GALFITM, extends GALFIT3's current single-band fitting process by simultaneously...
Päätekijät: | , , , , , |
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Aineistotyyppi: | Journal article |
Kieli: | English |
Julkaistu: |
2013
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