MegaMorph -- multi-wavelength measurement of galaxy structure: Sérsic profile fits to galaxies near and far

We demonstrate a new multi-wavelength technique for two-dimensional parametric modelling of galaxy surface-brightness profiles, which we have incorporated into the widely used software GALFIT. Our new method, named GALFITM, extends GALFIT3's current single-band fitting process by simultaneously...

Täydet tiedot

Bibliografiset tiedot
Päätekijät: Vika, M, Bamford, S, Haeussler, B, Rojas, A, Borch, A, Nichol, R
Aineistotyyppi: Journal article
Kieli:English
Julkaistu: 2013