Real-space Measurements of Bonding Charge Density in Aberration-corrected HREM
Príomhchruthaitheoirí: | Ciston, J, Haigh, S, Kim, J, Kirkland, A, Marks, L |
---|---|
Formáid: | Journal article |
Foilsithe / Cruthaithe: |
2009
|
Míreanna comhchosúla
Míreanna comhchosúla
-
Real-space measurements of bonding charge density in aberration-corrected high resolution electron microscopy
de réir: Ciston, J, et al.
Foilsithe / Cruthaithe: (2009) -
Optimized conditions for imaging the effects of bonding charge density in electron microscopy.
de réir: Ciston, J, et al.
Foilsithe / Cruthaithe: (2011) -
Aberration-corrected HREM/STEM for semiconductor research
de réir: Hetherington, C, et al.
Foilsithe / Cruthaithe: (2005) -
A versatile double aberration-corrected, energy filtered HREM/STEM for materials science.
de réir: Hutchison, J, et al.
Foilsithe / Cruthaithe: (2005) -
Aberration-Corrected Imaging in CTEM
de réir: Haigh, S, et al.
Foilsithe / Cruthaithe: (2011)